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NDS332P P-Channel Logic Level Enhancement Mode Field Effect Transistor June 1997

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NDS332P P-Channel Logic Level Enhancement Mode Field Effect Transistor June 1997
June 1997
NDS332P
P-Channel Logic Level Enhancement Mode Field Effect Transistor
General Description
Features
These P-Channel logic level enhancement mode power field
effect transistors are produced using Fairchild's proprietary, high
cell density, DMOS technology. This very high density process is
especially tailored to minimize on-state resistance. These
devices are particularly suited for low voltage applications such as
notebook computer power management, portable electronics,
and other battery powered circuits where fast high-side
switching, and low in-line power loss are needed in a very small
outline surface mount package.
-1 A, -20 V, RDS(ON) = 0.41 Ω @ VGS= -2.7 V
RDS(ON) = 0.3 Ω @ VGS = -4.5 V.
Very low level gate drive requirements allowing direct
operation in 3V circuits. VGS(th) < 1.0V.
Proprietary package design using copper lead frame for
superior thermal and electrical capabilities.
High density cell design for extremely low RDS(ON).
Exceptional on-resistance and maximum DC current
capability.
Compact industry standard SOT-23 surface Mount
package.
________________________________________________________________________________
D
G
AEsolute Maximum Ratings
T A = 25°C unless otherwise noted
Symbol
Parameter
VDSS
Drain-Source Voltage
VGSS
Gate-Source Voltage - Continuous
ID
Drain Current - Continuous
PD
Maximum Power Dissipation
(Note 1a)
- Pulsed
NDS332P
Units
-20
V
±8
V
-1
A
-10
(Note 1a)
(Note 1b)
TJ,TSTG
S
Operating and Storage Temperature Range
0.5
W
0.46
-55 to 150
°C
THERMAL CHARACTERISTICS
RθJA
Thermal Resistance, Junction-to-Ambient
(Note 1a)
RθJC
Thermal Resistance, Junction-to-Case
(Note 1)
© 1997 Fairchild Semiconductor Corporation
250
°C/W
75
°C/W
NDS332P Rev. E
Electrical Characteristics (TA = 25°C unless otherwise noted)
Symbol
Parameter
Conditions
Min
-20
Typ
Max
Units
OFF CHARACTERISTICS
BVDSS
Drain-Source Breakdown Voltage
VGS = 0 V, ID = -250 µA
IDSS
Zero Gate Voltage Drain Current
VDS = -16 V, VGS = 0 V
V
TJ = 55°C
-1
µA
-10
µA
IGSS
Gate - Body Leakage Current
VGS = 8 V, VDS= 0 V
100
nA
IGSS
Gate - Body Leakage Current
VGS = -8 V, VDS= 0 V
-100
nA
V
ON CHARACTERISTICS (Note 2)
VGS(th)
Gate Threshold Voltage
VDS = VGS, ID = -250 µA
TJ =125°C
RDS(ON)
Static Drain-Source On-Resistance
-0.4
-0.6
-1
-0.3
-0.45
-0.8
0.35
0.41
0.5
0.74
0.26
0.3
VGS = -2.7 V, ID = -1 A
TJ =125°C
VGS = -4.5 V, ID = -1.1 A
ID(ON)
gFS
On-State Drain Current
Forward Transconductance
VGS = -2.7 V, VDS = -5 V
-1.5
VGS = -4.5 V, VDS = -5 V
-2.5
Ω
A
VDS = -5 V, ID= -1 A
2.2
S
VDS = -10 V, VGS = 0 V,
f = 1.0 MHz
195
pF
105
pF
40
pF
DYNAMIC CHARACTERISTICS
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
SWITCHING CHARACTERISTICS (Note 2)
tD(on)
Turn - On Delay Time
tr
Turn - On Rise Time
tD(off)
tf
Qg
Total Gate Charge
Qgs
Gate-Source Charge
Qgd
Gate-Drain Charge
VDD = -6 V, ID = -1 A,
VGS = -4.5 V, RGEN = 6 Ω
8
15
ns
30
45
ns
Turn - Off Delay Time
25
45
ns
Turn - Off Fall Time
27
45
ns
3.7
5
nC
VDS = -5 V, ID = -1 A,
VGS = -4.5 V
0.5
nC
0.9
nC
NDS332P Rev. E
Electrical Characteristics (TA = 25°C unless otherwise noted)
Symbol
Parameter
Conditions
Min
Typ
Max
Units
-0.42
A
-1.2
V
DRAIN-SOURCE DIODE CHARACTERISTICS AND MAXIMUM RATINGS
IS
Maximum Continuous Source Current
VSD
Drain-Source Diode Forward Voltage
VGS = 0 V, IS = -0.42 A (Note 2)
-0.75
Notes:
1. RθJA is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of the drain pins. RθJC is guaranteed by
design while RθCA is determined by the user's board design.
PD (t) =
T J −T A
R θJA (t)
=
T J −T A
R θJC +R θCA (t)
= I 2D(t) × R DS(ON)@T J
Typical RθJA using the board layouts shown below on 4.5"x5" FR-4 PCB in a still air environment:
a. 250oC/W when mounted on a 0.02 in2 pad of 2oz copper.
b. 270oC/W when mounted on a 0.001 in2 pad of 2oz copper.
1a
1b
Scale 1 : 1 on letter size paper
2. Pulse Test: Pulse Width < 300µs, Duty Cycle < 2.0%.
NDS332P Rev. E
Typical Electrical Characteristics
-2.5
-3.5
-3.0
-2
-2.7
RDS(ON) , NORMALIZED
I D , DRAIN-SOURCE CURRENT (A)
VGS = -4.5V
-2.0
-1.5
-1
-1.5
-0.5
0
DRAIN-SOURCE ON-RESISTANCE
1.8
-2.5
1.6
1.4 VGS =-2.0V
1.2
-2.5
1
-0.5
V
DS
-1
-1.5
-2
-2.5
, DRAIN-SOURCE VOLTAGE (V)
-3.0
-3.5
0.8
-4.5
0.6
0.4
0
-3
0
-2.5
-3
1.8
R DS(on), NORMALIZED
1.6
1.4
1.2
1
0.8
0.6
0.4
-50
-25
0
25
50
75
100
T , JUNCTION TEMPERATURE (°C)
125
DRAIN-SOURCE ON-RESISTANCE
I D = -1A
V GS = -2.7
V GS = -2.7 V
1.4
1.2
25°C
1
-55°C
0.8
0.6
0
-0.5
25°C
V DS = - 3V
T = -55°C
J
125°C
-0.9
-0.6
-0.3
-1
V
GS
-1.25
-1.5
-1.75
, GATE TO SOURCE VOLTAGE (V)
Figure 5. Transfer Characteristics.
-2
GATE-SOURCE THRESHOLD VOLTAGE (V)
-1.5
-0.75
-2.5
-3
Figure 4. On-Resistance Variation
with Drain Current and Temperature.
Figure 3. On-Resistance Variation
with Temperature.
0
-0.5
-1
-1.5
-2
I , DRAIN CURRENT (A)
D
J
-1.2
TJ = 125°C
1.6
0.4
150
Vth , NORMALIZED
R DS(ON) , NORMALIZED
-1
-1.5
-2
I , DRAIN CURRENT (A)
Figure 2. On-Resistance Variation
with Drain Current and Gate Voltage.
1.8
DRAIN-SOURCE ON-RESISTANCE
-0.5
D
Figure 1. On-Region Characteristics.
I D , DRAIN CURRENT (A)
-2.7
1.15
V DS = VGS
1.1
I
D
= -250µA
1.05
1
0.95
0.9
0.85
0.8
-50
-25
0
25
50
75
100
TJ , JUNCTION TEMPERATURE (°C)
125
150
Figure 6. Gate Threshold Variation
with Temperature.
NDS332P Rev.E
Typical Electrical Characteristics (continued)
1
VGS =0V
-I , REVERSE DRAIN CURRENT (A)
I D = -250µA
1.08
1.04
1
0.96
0.1
0.05
TJ = 125°C
0.01
0.92
-50
-25
0
T
J
25
50
75
100
, JUNCTION TEMPERATURE (°C)
125
-55°C
0.001
0.0001
150
0
0.2
0.4
0.6
0.8
-V SD , BODY DIODE FORWARD VOLTAGE (V)
1
Figure 8. Body Diode ForwardVoltageVariation with
Source Current and Temperature.
Figure 7. Breakdown Voltage Variation with
Temperature.
5
-V GS , GATE-SOURCE VOLTAGE (V)
500
300
CAPACITANCE (pF)
25°C
S
BV DSS , NORMALIZED
DRAIN-SOURCE BREAKDOWN VOLTAGE
1.12
VDS = -5V
I D = -1A
-10V
4
200
Ciss
100
Coss
-15V
3
2
50
30
20
0.1
Crss
f = 1 MHz
VGS = 0V
0.2
-V
DS
0.5
1
2
5
, DRAIN TO SOURCE VOLTAGE (V)
10
1
0
20
Figure 9. Capacitance Characteristics.
1
ton
t d(on)
t d(off)
90%
V OUT
VOUT
10%
10%
DUT
G
5
tf
90%
D
R GEN
4
t off
tr
RL
VIN
2
3
Q g , GATE CHARGE (nC)
Figure 10. Gate Charge Characteristics.
VDD
VGS
0
90%
V IN
50%
50%
S
10%
PULSE WIDTH
Figure 11. Switching Test Circuit.
INVERTED
Figure 12. Switching Waveforms.
NDS332PRev. E
20
4
VDS =- 5V
-I D , DRAIN CURRENT (A)
3
25°C
125°C
2
1m
10
TJ = -55°C
1
5
N)
S(O
RD
2
g
100
-0.5
-1
-1.5
-2
I D, DRAIN CURRENT (A)
-2.5
10s
DC
V GS = -2.7V
SINGLE PULSE
RθJA = See Note 1b
TA = 25°C
0.01
0.1
-3
ms
1s
0.1
0.2
0.5
1
2
5
10
-VDS , DRAIN-SOURCE VOLTAGE (V)
20
Figure 13. Transconductance Variation with
Drain Current and Temperature.
Figure 14. Maximum Safe Operating Area.
1
1.4
-ID , STEADY-STATE DRAIN CURRENT (A)
STEADY-STATE POWER DISSIPATION (W)
0
0.8
0.6
1a
1b
0.4
0.2
0
4.5"x5" FR-4 Board
TA = 25 oC
Still Air
0
0.1
0.2
0.3
2oz COPPER MOUNTING PAD AREA (in 2)
0.4
s
10m
s
1
0.03
0
IT
LIM
0.5
FS
, TRANSCONDUCTANCE (SIEMENS)
Typical Electrical Characteristics (continued)
50
1.2
1
1b
1a
4.5"x5" FR-4 Board
TA = 25 oC
Still Air
VGS = -2.7V
0.8
0.6
0
0.1
0.2
0.3
2
2oz COPPER MOUNTING PAD AREA (in )
0.4
Figure 16. Maximum Steady-State Drain
Current versus Copper Mounting Pad Area.
Figue 15. SuperSOTTM _ 3 Maximum
Steady-State Power Dissipation versus
Copper Mounting Pad Area.
r(t), NORMALIZED EFFECTIVE
TRANSIENT THERMAL RESISTANCE
1
0.5
0.2
D = 0.5
R θJA (t) = r(t) * R θJA
R θJA = See Note 1b
0.2
0.1
0.1
0.05
0.05
0.02
0.01
0.005
P(pk)
0.02
t1
0.01
t2
TJ - TA = P * R θJA (t)
Single Pulse
Duty Cycle, D = t1 /t2
0.002
0.001
0.0001
0.001
0.01
0.1
t 1 , TIME (sec)
1
10
100
300
Figure 17. Transient Thermal Response Curve.
Note : Characterization performed using the conditions described in note 1b. Transient thermal response will
change depending on the circuit board design.
NDS332PRev. E
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Datasheet contains the design specifications for product development. Specifications may change
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Rev. I68
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