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BDTIC
BF P410
BDTIC
In ves ti gat i on o f P ha s e N oi s e i n K uBan d DR Os us i ng BF P410
Phas e noi s e pe rfo r ma nc e vs .
c ol l ec to r c urre nt
Appl i c ati o n N ote A N 235
Revision: Rev. 1.0
2010-08-11
RF and P r otec ti on D evi c es
www.BDTIC.com/infineon
BDTIC
Edition 2010-08-11
Published by
Infineon Technologies AG
81726 Munich, Germany
© 2010 Infineon Technologies AG
All Rights Reserved.
Legal Disclaimer
The information given in this document shall in no event be regarded as a guarantee of conditions or
characteristics. With respect to any examples or hints given herein, any typical values stated herein and/or any
information regarding the application of the device, Infineon Technologies hereby disclaims any and all
warranties and liabilities of any kind, including without limitation, warranties of non-infringement of intellectual
property rights of any third party.
Information
For further information on technology, delivery terms and conditions and prices, please contact the nearest
Infineon Technologies Office (www.infineon.com).
Warnings
Due to technical requirements, components may contain dangerous substances. For information on the types in
question, please contact the nearest Infineon Technologies Office.
Infineon Technologies components may be used in life-support devices or systems only with the express written
approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the
failure of that life-support device or system or to affect the safety or effectiveness of that device or system. Life
support devices or systems are intended to be implanted in the human body or to support and/or maintain and
sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other
persons may be endangered.
www.BDTIC.com/infineon
BFP410
BFP410 Phase Noise in DROs
Application Note AN235
Revision History: 2010-08-11
Previous Revision: prev. Rev. x.x
Page
Subjects (major changes since last revision)
BDTIC
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STANDARDIZATION. MATLAB™ of MathWorks, Inc. MAXIM™ of Maxim Integrated Products, Inc.
MICROTEC™, NUCLEUS™ of Mentor Graphics Corporation. Mifare™ of NXP. MIPI™ of MIPI Alliance, Inc.
MIPS™ of MIPS Technologies, Inc., USA. muRata™ of MURATA MANUFACTURING CO. OmniVision™ of
OmniVision Technologies, Inc. Openwave™ Openwave Systems Inc. RED HAT™ Red Hat, Inc. RFMD™ RF
Micro Devices, Inc. SIRIUS™ of Sirius Sattelite Radio Inc. SOLARIS™ of Sun Microsystems, Inc. SPANSION™
of Spansion LLC Ltd. Symbian™ of Symbian Software Limited. TAIYO YUDEN™ of Taiyo Yuden Co.
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of Texas Instruments Incorporated. VXWORKS™, WIND RIVER™ of WIND RIVER SYSTEMS, INC. ZETEX™
of Diodes Zetex Limited.
Last Trademarks Update 2009-10-19
www.BDTIC.com/infineon
Application Note AN235, Rev. 1.0
3 / 12
2010-08-11
BFP410
BFP410 Phase Noise in DROs
List of Content, Figures and Tables
Table of Content
1
1.1
Overview ............................................................................................................................................. 5
Test Setup ............................................................................................................................................ 6
2
Test Results ........................................................................................................................................ 7
Author ................................................................................................................................................ 11
List of Figures
Figure 1
Figure 2
Figure 3
Figure 4
Figure 5
Figure 6
Figure 7
Figure 8
Figure 9
Flicker Noise Performance of BFP410 ................................................................................................. 5
Setup for Measuring Phase Noise. ...................................................................................................... 6
7
8
Phase Noise at 7.5 mA – logarithmic plot ............................................................................................ 8
Phase Noise at 9 mA – logarithmic plot ............................................................................................... 9
Phase Noise at 11 mA – logarithmic plot ............................................................................................. 9
Phase Noise at 14 mA – logarithmic plot ........................................................................................... 10
Phase Noise at 20 mA – logarithmic plot ........................................................................................... 10
BDTIC
List of Tables
Table 1
Phase Noise vs. DC current and offset frequency ............................................................................... 7
www.BDTIC.com/infineon
Application Note AN235, Rev. 1.0
4 / 12
2010-08-11
BFP410
BFP410 Phase Noise in DROs
Overview
1
Overview
This application note shows how different DC supply currents affect the phase noise of a DRO.
One parameter strongly affecting the phase noise performance is the flicker noise (1/f - noise) of the transistor
used as the active element in the oscillator circuit. Other parameters are loaded Q of the resonator or the Noise
Factor F, for example.
Figure 1 shows the 1/f-noise of Infineon’s BFP410 bipolar transistor for different collector currents over
frequency. It can clearly be seen that reducing the collector current results in lower 1/f-noise.
The question that led to this application note was how much will the phase noise performance of a DRO
improve when the current consumption of the transistor is reduced.
BDTIC
BFP410 1/f-noise
(VCE=3V, RG=2kΩ,
Ω, TA=25°C, IC: Parameter)
50
45
5 mA
10 mA
40
15 mA
35
20 mA
NF [dB]
30
25
20
15
10
5
0
10
100
1000
10000
100000
f [Hz]
Figure 1
Flicker Noise Performance of BFP410
www.BDTIC.com/infineon
Application Note AN235, Rev. 1.0
5 / 12
2010-08-11
BFP410
BFP410 Phase Noise in DROs
Overview
1.1
Test Setup
The current consumption of BFP410 in the LNB that was used for testing was changed by modifiying the values
of the biasing resistors. Current consumption was calculated by checking the voltage drop over a resistor
connecting from Vcc to the transistor’s collector.
A block diagram of the test setup that was used for measuring phase noise is displayed in the next picture.
The LNB was powered with a standard lab DC source. All components on the LNB were running as they would
do in normal operation when receiving satellite signals.
The signal of the 9.75 GHz DRO was monitored using a horn antenna. The signal couples through the closed
cover of the LNB. Having the cover open would have extremely affected the behavior of the LNB. But even with
closed lid the DRO’s signal was strong enough to be easily detected.
BDTIC
A RF amplifier was used to boost signal strength so there was enough dynamic range to perform the actual
phase noise measurement with a spectrum analyzer.
Figure 2
Setup for Measuring Phase Noise.
www.BDTIC.com/infineon
Application Note AN235, Rev. 1.0
6 / 12
2010-08-11
BFP410
BFP410 Phase Noise in DROs
Test Results
2
Test Results
The following pages show the results of the phase noise measurements at different currents.
It can be seen that there is a phase noise minimum when adjusting the collector current to about 11 mA.
Furtherly reducing the current results again in increasing phase noise figures.
Table 1
Phase Noise vs. DC current and offset frequency
Phase Noise / (dBc/Hz) at offset frequency of:
DC current / mA
7.5
1 kHz
9
11
10 kHz
100 kHz
BDTIC
-72.8
-98.6
-107.9
-75.3
-99.1
-109.5
-78.4
-100.3
-109.7
14
-74.8
-98.8
-110.3
20
-66.7
-94.1
-110.0
Phase Noise vs. Offset Frequency
-60
-70
Phase Noise / (dBc/Hz)
-80
20mA
-90
14mA
11mA
9mA
7.5mA
-100
-110
-120
1
10
100
Offset Frequency / kHz
Figure 3
www.BDTIC.com/infineon
Application Note AN235, Rev. 1.0
7 / 12
2010-08-11
BFP410
BFP410 Phase Noise in DROs
Test Results
Phase Noise vs. Current
-65
-70
-75
Phase Noise / (dBc/Hz)
-80
-85
-90
1kHz
10kHz
-95
100kHz
BDTIC
-100
-105
-110
-115
7
8
9
10
11
12
13
14
15
16
17
18
19
20
Icc / mA
Figure 4
Figure 5
Phase Noise at 7.5 mA – logarithmic plot
www.BDTIC.com/infineon
Application Note AN235, Rev. 1.0
8 / 12
2010-08-11
BFP410
BFP410 Phase Noise in DROs
Test Results
BDTIC
Figure 6
Phase Noise at 9 mA – logarithmic plot
Figure 7
Phase Noise at 11 mA – logarithmic plot
www.BDTIC.com/infineon
Application Note AN235, Rev. 1.0
9 / 12
2010-08-11
BFP410
BFP410 Phase Noise in DROs
Test Results
BDTIC
Figure 8
Phase Noise at 14 mA – logarithmic plot
Figure 9
Phase Noise at 20 mA – logarithmic plot
www.BDTIC.com/infineon
Application Note AN235, Rev. 1.0
10 / 12
2010-08-11
BFP410
BFP410 Phase Noise in DROs
Author
Author
Dietmar Stolz, Staff Engineer of Business Unit “RF and Protection Devices”
BDTIC
www.BDTIC.com/infineon
Application Note AN235, Rev. 1.0
11 / 12
2010-08-11
BDTIC
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AN235
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