VALID 2009

Reviewers
VALID 2009
Miron Abramovici, DAFCA, USA
Amirhossein Alimohammad, Ukalta Engineering/CTO, Canada
César Andrés, Universidad Complutense de Madrid, Spain
Alberto Bacchelli, Università della Svizzera Italiana, Switzerland
Cesare Bartolini, ISTI-CNR-Pisa, Italy
Andrea Baruzzo, Università degli Studi di Udine, Italy
Domenico Bianculli, Università della Svizzera Italiana, Switzerland
Alberto Bosio, LIRMM - University of Montpellier 2, France
Mikey Browne, IBM, USA
Mauro Caporuscio, INRIA Paris-Rocquencourt, France
Ramaswamy Chandramouli, National Institute of Standards
and Technology-Gaithersburg, USA
Hervé Chang, University of Milano-Bicocca, Italy
Annie Combelles, LE VISIUM, France
Marco Comini, University of Udine, Italy
Flavio Corradini, Università degli Studi di Camerino, Italy
Florian Deissenboeck, Technische Universität München-München, Germany
Maria Rita Di Berardini, University of Camerino, Italy
Stefano Di Carlo, Politecnico di Torino, Italy
Antinisca Di Marco, University of L'Aquila, Italy
Petre Dini, Cisco Systems, Inc., USA / Concordia University, Canada
Lydie du Bousquet, Laboratoire d'Informatique de Grenoble (LIG), France
Bill Eklow, Cisco Systems, Inc., USA
Khaled El-Fakih, American University of Sharjah, UAE
Eitan Farchi, IBM Haifa Research Laboratory, Israel
Ricardo Massa Ferreira Lima, Center for Informatics - Federal University
of Pernambuco, Brazil
Gordon Fraser, Graz University of Technology, Austria
Linus Freeman, Computer Sciences Corporation (CSC), Italy
Jens Grabowski, Institute of Computer Science-Goettingen, Germany
Hans-Gerhard Gross, Delft University of Technology, The Netherlands
Patrick Girard, LIRMM, France
Kazumi Hatayama, Semiconductor Technology Academic
Research Center (STARC), Japan
Jon Hall, Open University, United Kingdom
Yu Huang, Mentor Graphics Co., USA
Florentin Ipate, University of Pitesti, Romania
David Kaeli, Northeastern University - Boston, USA
Mika Katara, Tampere University of Technology, Finland
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Moonzoo Kim, KAIST, South Korea
Daniel Larsson, Cybercom Sweden South AB, Sweden
Pascal Lorenz, University of Huate Alsace, France
Tiziana Margaria, University Potsdam, Germany
Anne Meixner, Intel-Oregon, USA
Atif M. Memon, University of Maryland-College Park, USA
Maria de Las Mercedes Garcia Merayo, Universidad Complutense de Madrid, Spain
Cecilia Metra, DEIS-ARCES-University of Bologna
Jani Metsä, Tampere University of Technology, Finland
Tommi Mikkonen, Tampere University of Technology, Finland
Geoff Miller, System z Resiliency / IBM, USA
Henry Muccini, University of L'Aquila, Italy
Helmut Neukirchen, University of Iceland, Iceland
Divide Pandini, ST Microelectronics, Italy
Patrizio Pelliccione, Università degli Studi dell'Aquila, Italy
Eric Piel, University of Technology of Delft, The Netherland
Miodrag Potkonjak, University of California - Los Angeles, USA
Wishnu Prasetya, University of Utrecht, The Netherlands
Paolo Prinetto, Politecnico di Torino, Italy
KK Rao, IBM, USA
Henrique Rebêlo, Federal University of Pernambuco, Brazil
Michel Renovell, LIRMM/University of Montpellier 2, France
Filippo Ricca, Unità CINI at DISI, University of Genova, Italy
Thomas Rings, University of Göttingen, Germany
Rosa Rodríguez-Montañés, Universitat Politècnica de Catalunya-Barcelona, Spain
Krzysztof Rogoz, Motorola, USA
Ina Schieferdecker, TU Berlin/Fraunhofer FOKUS, Germany
Holger Schlingloff, Fraunhofer FIRST/Humboldt-Universität zu Berlin, Germany
Pierre-Yves Schobbens, Facultés Universitaires Notre-Dame
de la Paix - Namur, France
Cristina Seceleanu, Mälardalen University, Sweden
Rajarajan Senguttuvan, Texas Instruments, USA
Mary Shapcott, University of Ulster, United Kingdom
Hamid Shojaei, Technical University of Eindhoven, The Netherlands
Avik Sinha, IBM T J Watson Research Center, USA
Sérgio Soares, University of Pernambuco, Brazil
Mani Soma, University of Washington-Seattle, USA
Alin Stefanescu, SAP Research, Germany
Mehdi Baradaran Tahoori, Northeastern University - Boston, USA
Massimo Tivoli, Università degli Studi dell'Aquila, Italy
Nur Touba, University of Texas at Austin, USA
Spyros Tragoudas, Southern Illinois University Carbondale, USA
Shmuel Ur, IBM-Haifa, Israel
Bart Vermeulen, NXP Semiconductors, USA
Arnaud Virazel, LIRMM - University of Montpellier 2, France
Tanja Vos, Universidad Politécnica de Valencia, Spain
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Stefan Wagner, Technische Universität München, Germany
Melanie P. Ware, University of Ulster - Jordanstown, Northern Ireland, United Kingdom
Stephan Weißleder, Humboldt-Universität zu Berlin / Fraunhofer FIRST, Germany
Weixin Wu, Virginia Tech, USA
Qiang Xu, The Chinese University of Hong Kong, Hong Kong
Cemal Yilmaz, Sabanci University-Istanbul, Turkey
Andy Zaidman, TU-Delft, The Netherlands
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